Publication | Open Access
The five-analyzer point-to-point scanning crystal spectrometer at ESRF ID26
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Citations
45
References
2020
Year
X-ray SpectroscopyEngineeringMicroscopySpectrochemical AnalysisX-ray FluorescenceAnalytical InstrumentationStructure DeterminationInstrumentationRadiologyPhysicsEsrf Id26Synchrotron RadiationX-ray Free-electron LaserCrystallographyRelative PlacementX-ray Emission SpectroscopyNatural SciencesSpectroscopyX-ray DiffractionApplied PhysicsRay-tracing Calculations
X-ray emission spectroscopy in a point-to-point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray-tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance.
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