High-throughput terahertz spectral line imaging using an echelon mirror

Abstract

This work demonstrates terahertz (THz) line imaging that acquires broadband spectral information by combining echelon-based single-shot THz spectroscopy with high-sensitivity phase-offset electrooptic detection. An approximately 40 dB signal-to-noise ratio is obtained for a THz spectrum from a single line of the camera, with a detection bandwidth up to 2 THz at the peak electric-field strength of 1.2 kV/cm. The spatial resolution of the image is confirmed to be diffraction limited for each spectral component of the THz wave. We use the system to image sugar tablets by quickly scanning the sample, which illustrates the capacity of the proposed spectral line imaging system for high-throughput applications.