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Synchrotron X-Ray Fluorescence: A New Approach for Determining Trace Element Concentrations in Individual Presolar SiC Grains
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2001
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Materials ScienceSynchrotron X-ray FluorescenceX-ray SpectroscopyEngineeringSpectroscopyTrace Element ConcentrationsApplied PhysicsNew ApproachSynchrotron RadiationElemental CharacterizationSynchrotron Radiation SourceCarbideX-ray Fluorescence
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