Publication | Open Access
Optical and Structural characterization of spraying ZrO2 and doped B: ZrO2 thin films
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Citations
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References
2020
Year
Atomic Force MicroscopyThin Film PhysicsOptical MaterialsStructural CharacterizationEngineeringThin Film Process TechnologyChemistryOptical PropertiesThin Film ProcessingMaterials ScienceOxide ElectronicsZro 2Abstract Zirconium OxideMaterial AnalysisNatural SciencesSurface ScienceApplied PhysicsThin FilmsChemical Vapor Deposition
Abstract Zirconium oxide (ZrO 2 ) and doped with boron (B) thin films were prepared by Chemical spray pyrolysis CSP. Optical band gap energy of the films decreased from 3.83 to 3.73.55 eV via increase of doping. X-XRD patterns disclosed that films structure were polycrystalline, mixture of monoclinic and tetragonal phases. Atomic force microscopy (AFM) results assure dependence of surface morphology and roughness upon doping.
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