Publication | Closed Access
Numerical junction temperature calculation method for reliability evaluation of power semiconductors in power electronics converters
17
Citations
45
References
2020
Year
ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware ReliabilityPower DeviceReliability EvaluationPower Semiconductor DeviceCircuit ReliabilityHeat TransferPower SemiconductorsPower ElectronicsThermal EngineeringPower Electronics ConvertersDevice Reliability
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|---|---|---|
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