Investigation of the Electrical Field Sensitivity of Sub-μm Y–Ba–Cu–O Detectors

Abstract

The behavior of submicrometer-sized thin-film <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="TeX">$\hbox{YBa}_{2}\hbox{Cu}_{3}\hbox{O}_{7-{\rm x}}$</tex-math></inline-formula> (YBCO) detectors under illumination with picosecond terahertz (THz) pulses was investigated. Real-time measurements with a temporal resolution of 15 ps full width at half maximum were performed at ANKA, the synchrotron facility of Karlsruhe Institute of Technology, and the UVSOR-III facility at the Institute for Molecular Science in Okazaki, Japan. The capability of YBCO detectors to reproduce the shape of a several picosecond long THz pulse was demonstrated. Single-shot measurements adhering to a reversal of the direction of the electrical field of the THz radiation were carried out. They provided evidence for the electrical field sensitivity of the YBCO detector. Exploiting the electrical field sensitivity of the YBCO detector, the effect of microbunching was observed at UVSOR-III.