Publication | Open Access
Facile and quantitative estimation of strain in nanobubbles with arbitrary symmetry in 2D semiconductors verified using hyperspectral nano-optical imaging
46
Citations
32
References
2020
Year
Optical MaterialsEngineeringNanosheetMicroscopyHyperspectral Nano-optical ImagingTwo-dimensional MaterialsElasticity TheoryCircular SymmetryMolecular DynamicsOptical PropertiesNanoscale ModelingDistorted Thin PlateNanometrologyNanoscale ScienceNanomechanicsNanophotonicsMaterials SciencePhysicsNanotechnologyQuantitative EstimationLayered MaterialNanocrystalline MaterialArbitrary SymmetryNanomaterialsApplied Physics
When layers of van der Waals materials are deposited via exfoliation or viscoelastic stamping, nanobubbles are sometimes created from aggregated trapped fluids. Though they can be considered a nuisance, nanobubbles have attracted scientific interest in their own right owing to their ability to generate large in-plane strain gradients that lead to rich optoelectronic phenomena, especially in the semiconducting transition metal dichalcogenides. Determination of the strain within the nanobubbles, which is crucial to understanding these effects, can be approximated using elasticity theory. However, the Föppl–von Kármán equations that describe strain in a distorted thin plate are highly nonlinear and often necessitate assuming circular symmetry to achieve an analytical solution. Here, we present an easily implemented numerical method to solve for strain tensors of nanobubbles with arbitrary symmetry in 2D crystals. The method only requires topographic information from atomic force microscopy and the Poisson ratio of the 2D material. We verify that this method reproduces the strain for circularly symmetric nanobubbles that have known analytical solutions. Finally, we use the method to reproduce the Grüneisen parameter of the E′ mode for 1L-WS2 nanobubbles on template-stripped Au by comparing the derived strain with measured Raman shifts from tip-enhanced Raman spectroscopy, demonstrating the utility of our method for estimating localized strain in 2D crystals.
| Year | Citations | |
|---|---|---|
Page 1
Page 1