BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity

Abstract

For the first time, we present a study of BTI and HCD degradation in a 32 × 64 cell SRAM array including Sense Amplifiers (SA), Write Drivers (WD) and pre-charging circuitry (one each for 64 columns) stimulated by the workload-induced activity of a commercial processor. In under 2 hours, our fully automated framework employs the extracted activities to create voltage waveforms used in SPICE simulations (SRAM Array, SA, WD) and degrades transistors using their individual exhibited voltages as stimuli in BTI and HCD models. We support different temperatures, supply voltages (including DVFS), SRAM, SA and WD designs.