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The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision

EngineeringElectron MicroscopyPhysicsMicroscopyNanotechnologyExit-wave Power-cepstrum TransformScanning Probe MicroscopyApplied PhysicsNanobeam Electron DiffractionElectron DiffractionRobust Strain Mapping