Annealing atmosphere-dependent electrical characteristics and bias stability of N-doped InZnSnO thin film transistors - Concepedia

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Annealing atmosphere-dependent electrical characteristics and bias stability of N-doped InZnSnO thin film transistors

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Citations

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References

2020

Year

Jinbao Su, Hui Yang, Yaobin Ma, Li Ran, Lanchao Jia, Depeng Liu, Xiqing Zhang

Materials Science in Semiconductor Processing

Electrical EngineeringAtmosphere-dependent Electrical CharacteristicsEngineeringApplied PhysicsSemiconductor MaterialBias StabilitySemiconductor Device

References

	Year	Citations

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