IEEE Microwave and Wireless Components Letters · 2020 · 26 citations · 6 references
EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesHigh-frequency Semiconductor DevicesIntegrated Circuit DesignMicrowave Integrated CircuitsMicrowave Semiconductor DevicesNoise In Semiconductor DevicesRadio-frequency Integrated CircuitsAvalanche NoiseHeterojunction Bipolar TransistorsInsertion LossInternal CalibrationMillimeter-wave Integrated CircuitsMonolithic Microwave Integrated CircuitsNoise CalibrationRadiometer Calibration
This letter presents a novel implementation of a V-band single-pole double-throw switch that facilitates the internal calibration of radiometers by integrating an ambient noise source and an avalanche noise source. The switch is implemented in a 0.13-μm SiGe bipolar-CMOS (BiCMOS) process and uses a shunt topology with λ/4 directional couplers that inject noise from the avalanche source. The avalanche source is implemented using the collector-base junction of a SiGe heterojunction bipolar transistor (HBT) and attains a measured excess noise ratio of 18.7 dB at 60 GHz. The switch achieves a midband insertion loss of 2.0 dB and an isolation of 22 dB at 60 GHz. An excess input-referred noise temperature of 620 K is added with the noise source ON. To the best of our knowledge, this is the first avalanche noise source using a diode-configured SiGe HBT and the first monolithic two-reference switch for calibrating millimeter-wave radiometers.
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Robert L. Schmid, Peter Song, Christopher T. Coen et al. · IEEE Transactions on Microwave Theory and Techniques · 2014 · 100 citations
João Carlos Azevedo Gonçalves, Haitham Ghanem, Simon Bouvot et al. · IEEE Transactions on Microwave Theory and Techniques · 2019 · 36 citations