Publication | Open Access
Temperature effect on structural and optical properties of V<sub>2</sub>O<sub>5</sub> thin films prepared by spray pyrolysis technique
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Citations
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References
2020
Year
Thin Film PhysicsOptical MaterialsEngineeringOptical GlassSpray Pyrolysis TechniqueThin Film Process TechnologySurface TechnologyOptical PropertiesTemperature EffectThin Film ProcessingAbsorption CoefficientThin-film TechnologyMaterials ScienceThin Film MaterialsMaterial AnalysisSurface ScienceApplied PhysicsMaterials CharacterizationX-ray DiffractionThin Film DevicesThin FilmsChemical Vapor Deposition
In this work, the effect of substrate temperature on structural and optical properties of V 2 O 5 thin films has been characterized by X-ray diffraction (XRD); SEM and transmission. The films mince has been prepared by Reactive Chemical Spraying technology in Liquid Phase (RCSLP) on glass substrates preheated at (350, 400, 450 and 500 °C). The X-ray diffraction analysis confirms that all layers are polycrystalline, and the preferred orientation of V 2 O 5 is the (001) plane. The morphology of V 2 O 5 thin films are porous nature and their particle’s shape is three-dimensional. The transmittance and absorbance of thin film were measured from which the optical constants (Energy gap, Refractive index, Absorption coefficient, Extinction coefficient and Optical dielectric constant) were determined.
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