Publication | Closed Access
Total ionizing dose effects on resistance stability of Pt/HfO2/Al2O3/TiN structure RRAM devices
14
Citations
19
References
2020
Year
Materials EngineeringMaterials ScienceEngineeringDose EffectsOxide ElectronicsResistance StabilityApplied PhysicsMemory DeviceSemiconductor MemoryMicroelectronicsPhase Change Memory
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