Attosecond-pulse metrology based on high-order harmonic generation

Abstract

An all-optical method to retrieve the temporal intensity profile of an extreme ultraviolet (XUV) attosecond pulse is proposed based on XUV-assisted high-order harmonic generation (HHG) by an intense infrared (IR) pulse. For a harmonic located on the XUV-induced high-energy plateau (beyond the IR HHG plateau), the measured harmonic yield as a function of the time delay between the XUV and IR pulses is shown to accurately map the temporal intensity profile of the XUV pulse. Single-color and two-color orthogonal, linearly polarized IR pulses are used to demonstrate the method.