Characterization of ion induced damage as a function of depth in proton irradiated pure Ti and Ti–6Al–4V

X-ray line broadening from filed aluminium and wolfram

G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations

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The Rietveld method

R. A. Young · 1993 · 2.6K citations

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Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction

Luca Lutterotti · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 1.1K citations

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Quantitative size-factors for metallic solid solutions

H. W. King · Journal of Materials Science · 1966 · 862 citations

Natural Sciences, Materials Engineering, Materials Science +13

The (hkl) Dependence of Diffraction-Line Broadening Caused by Strain and Size for all Laue Groups in Rietveld Refinement

Nicolæ Popa · Journal of Applied Crystallography · 1998 · 630 citations

Natural Sciences, Materials Engineering, Materials Science +13