Fault diagnosis in electronic circuits based on bilinear transformation in 3D and 4D space

Abstract

In the paper a new method of localisation and identification of faulty components in linear electronic circuits based on bilinear transformation in 3D and 4D space is presented, as well as illustrating examples. The method can be applied in an input-output diagnosis of electronic circuits with the aid of different technologies: conventional measurement systems, testing buses and neural networks. It is also useful for parameter identification of other objects modelled by electrical circuits (electrochemical, biomedical, and electromechanical objects). The method can be utilised in practice for localisation and identification of single as well as double soft faults.