Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests

Abstract

In automotive and aeronautic industries, the requirements for EMC radiated immunity compliance of electronic equipment are severe and may force the suppliers to multiply the phases of prototyping to qualify their products. The cost of EMC qualification in an accredited laboratory is high and often requires the presence of EMC experts to interpret the results and find out the cause of noncompliance. The development of a fast, simple and reliable investigative tool becomes essential in a context of reduced costs. The method of near-field scanning in immunity developed for IC susceptibility evaluation seems to be a solution to identify and locate problems of immunity of an electronic board.