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<i>(Invited)</i> Electrical Properties of (100) β-Ga<sub>2</sub>O<sub>3</sub> Schottky Diodes with Four Different Metals
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2019
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Materials ScienceSurface CharacterizationElectrical EngineeringSemiconductor TechnologyEngineeringOxide ElectronicsSurface AnalysisSurface ScienceApplied PhysicsFour Different MetalsGallium OxideSemiconductor MaterialMetal ContactThin FilmsAu ContactsSchottky Barrier HeightsCompound Semiconductor
In this study, electrical properties of four metals (W, Mo, Au, Ni) as Schottky contacts on n-type (100)-oriented β-Ga2O3 substrates grown by the Czochralski method are reported. The Schottky barrier heights for each metal contact were calculated from I-V and/or C-V measurements. Two methods were used to cross check the Schottky barrier heights (φB) and ideality factors (n) calculated from I-V measurements. The Schottky barrier height values calculated from C-V and I-V measurements showed excellent agreement with each other and increased with an increase in the metal work functions. Some anomalous behavior of Au contacts, which is similar to behavior reported on (010)-oriented β-Ga2O3, is also described.