Publication | Closed Access
Effect of thickness-dependent structural defects on electrical stability of MoS2 thin film transistors
20
Citations
33
References
2019
Year
Materials ScienceElectrical EngineeringThickness-dependent Structural DefectsEngineeringElectrical StabilityBias Temperature InstabilityOxide ElectronicsApplied PhysicsDefect FormationSemiconductor Device
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