Quantum Yield Bias in Materials With Lower Absorptance

Abstract

Quantum yield (QY) is an essential parameter for the optical characterization of light-emitting materials, for applications in $e.g.$ optoelectronics. This study points out a systematic bias present in standard QY methodology for samples with lower absorption. The bias manifests itself as an absorption-dependent underestimation of QY, and might lead to misinterpretation of QY dependences on parameters that are linked to absorption, such as the excitation wavelength. This work addresses that bias and offers a correction procedure, and thus could have dramatic impact on a great number and variety of applications.