A strong loophole-free test of local realism

Abstract

Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text L. K. Shalm, E. Meyer-Scott, B. G. Christensen, P. Bierhorst, M. A. Wayne, M. J. Stevens, T. Gerrits, S. Glancy, D. R. Hamel, M. S. Allman, K. J. Coakley, S. D. Dyer, C. Hodge, A. E. Lita, V. B. Verma, C. Lambrocco, E. Tortorici, A. L. Migdall, Y. Zhang, D. R. Kumor, W. H. Farr, F. Marsili, M. D. Shaw, J. A. Stern, C. Abellán, W. Amaya, V. Pruneri, T. Jennewein, M. W. Mitchell, P. G. Kwiat, J. C. Bienfang, R. P. Mirin, E. Knill, and S. W. Nam, "A strong loophole-free test of local realism," in Conference on Lasers and Electro-Optics, OSA Technical Digest (online) (Optica Publishing Group, 2016), paper FW4C.1. Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article