Atomic Layer Deposition of Photoconductive Cu₂O Thin Films

Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn

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Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

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Highly active oxide photocathode for photoelectrochemical water reduction

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P-type electrical conduction in transparent thin films of CuAlO2

Hiroshi Kawazoe, Masahiro Yasukawa, Hiroyuki Hyodo et al. · Nature · 1997 · 2.1K citations

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Advanced analysis of copper X‐ray photoelectron spectra

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