Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs - Concepedia

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Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs

DOI Full Paper Access

85

Citations

16

References

2019

Year

Eduardo Pérez, D. Maldonado, Christian Acal, Juan Eloy Ruiz‐Castro, Francisco Alonso, Ana M. Aguilera, F. Jiménez-Molinos, Christian Wenger, J.B. Roldán

Microelectronic Engineering

Materials ScienceElectrical EngineeringEngineeringCycle-to-cycle VariabilityNanoelectronicsApplied PhysicsHfo2/tin RramsMicroelectronics

References

	Year	Citations

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