Applied Physics Letters · 2019 · 21 citations · 22 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials PhysicsOptical MaterialsInfrared SpectroscopyOptical Properties Of MaterialsOptical Properties Of SolidsPlasmonic MaterialsRaman SpectroscopyThin Film Optical PropertiesEffective MassEllipsometryInfrared Absorption SpectraInfrared SpectraOptical Thin Film CharacterizationPhonon Contributions To PermittivitySpectroscopic EllipsometryThin Oxide Films
The ordinary and extraordinary infrared dielectric functions of α-Ga2O3 thin films with the corundum structure were investigated. The films were grown by mist chemical vapor epitaxy on (101¯0) sapphire substrates in (101¯0) surface orientation. They were doped by the donor tin with the resulting free-electron concentrations between 1017 and 1019 cm−3. Structural characterization revealed the absence of strain and the high crystallographic quality of the samples. It allows one to resolve all 7 Raman modes. 5 out of 6 infrared active transverse optical phonon modes lie in the investigated wave number range >250 cm−1, and are unambiguously identified by spectroscopic ellipsometry. For the highest doped sample, the free-carrier contribution (plasmon) to the infrared spectra allowed accurate determination of effective electron masses. They are m⊥*=(0.297±0.010)m0 (perpendicular to [0001]) and m||*=(0.316±0.007)m0 (parallel to [0001]) for an electron concentration of n = 1.1 × 1019 cm−3.
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M. Schubert, Rafał Korlacki, Sean Knight et al. · Physical review. B./Physical review. B · 2016 · 213 citations · Full text
Toshiyuki Kawaharamura, Giang T. Dang, Mamoru Furuta · Japanese Journal of Applied Physics · 2012 · 155 citations
Natural Sciences, Materials Engineering, Materials Science +17
Kazuaki Akaiwa, Shizυo Fujita · Japanese Journal of Applied Physics · 2012 · 128 citations
Natural Sciences, Materials Engineering, Materials Science +17