Concepedia

Physical properties of the ferroelectric capacitors based on Al-doped HfO2 grown via Atomic Layer Deposition on Si

Silviu Vulpe, Florin Năstase, Mircea Dragoman, Adrian Dinescu, Cosmin Romanițan, Sorina Iftimie, A. Moldovan, Nicoleta G. Apostol

Applied Surface Science · 2019 · 21 citations · 32 references

DOI

Concepts

References

32

Ferroelectricity in hafnium oxide thin films

T. S. Böscke, Johannes Müller, D. Bräuhaus et al. · Applied Physics Letters · 2011 · 2.7K citations

, , +17

Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

C. D. Wagner, Lawrence E. Davis, M. Zeller et al. · Surface and Interface Analysis · 1981 · 2.1K citations

, , +9

Conduction Mechanism of Valence Change Resistive Switching Memory: A Survey

Ee Wah Lim, Razali Ismail · Electronics · 2015 · 795 citations · Full text

, , +17

Review and perspective on ferroelectric HfO2-based thin films for memory applications

Min Hyuk Park, Young Hwan Lee, Thomas Mikolajick et al. · MRS Communications · 2018 · 557 citations · Full text

, , +14

Pathways towards ferroelectricity in hafnia

Tran Doan Huan, Vinit Sharma, George A. Rossetti et al. · Physical Review B · 2014 · 508 citations · Full text

, , +17