Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies - Concepedia

Concepedia

Publication | Open Access

Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies

DOI Full Paper Access

46

Citations

70

References

2019

Year

Siddardha Koneti, Lucian Roiban, Florent Dalmas, Cyril Langlois, Anne‐Sophie Gay, Amandine Cabiac, Thomas Grenier, Hussein Banjak, Voichiţa Maxim, Thierry Épicier

Materials Characterization

EngineeringElectron MicroscopyMicroscopyElectron SpectroscopySpectroscopyApplied PhysicsBiomedical ImagingMicroanalysisElectron MicroscopeFast Electron TomographySensitive SamplesInstrumentationSitu TemTomographyRadiology

References

	Year	Citations

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