Composition determination of semiconductor alloys towards atomic accuracy by HAADF-STEM

Lennart Duschek, Pirmin Kükelhan, Andreas Beyer, Saleh Firoozabadi, J. O. Oelerich, Christian Fuchs, W. Stolz, Andrea Ballabio, Giovanni Isella, Kerstin Volz

Ultramicroscopy · 2019 · 18 citations · 48 references

Concepts

References

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