Thin Solid Films · 2019 · 20 citations · 26 references
Natural SciencesMaterials EngineeringMaterials ScienceInterface ScienceSurface ChemistrySurface ScienceInterface EngineeringSemiconductor InterfacesSemiconductor NanomaterialsSemiconductor SurfacesSurface PhysicsX-ray CrystallographyCarbon Diffusion CoatingsDiffusion BarriersExtended X-ray Absorption Fine StructureTwo-dimensional Semiconductor InterfacesX-ray Reflectivity
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Surface Studies of Solids by Total Reflection of X-Rays
L. G. Parratt · Physical Review · 1954 · 5.1K citations
Analysis of multiple-scattering XAFS data using theoretical standards
M. Newville, Bruce Ravel, D. Haskel et al. · Physica B Condensed Matter · 1995 · 747 citations