Journal of Materials Science Materials in Electronics · 2019 · 24 citations · 24 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMaterials CharacterizationOptical MaterialsAluminum OxidesDopingInorganic MaterialsMetal OxidesOptical Properties Of SemiconductorsOxide SemiconductorsAluminum-doped Zinc OxideCharge Carrier DensityCharge Density AnalysisOxide StructureZinc Oxides
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The Scherrer Formula for X-Ray Particle Size Determination
A. L. Patterson · Physical Review · 1939 · 8.9K citations