A Hierarchical Multiclassifier System for Automated Analysis of Delayered IC Images

Deruo Cheng, Yiqiong Shi, Bah‐Hwee Gwee, Kar‐Ann Toh, Tong Lin

IEEE Intelligent Systems · 2018 · 18 citations · 12 references

Concepts

Abstract

A robust and accurate machine learning based hierarchical multiclassifier system is proposed to automate the retrieval of interconnection information from delayered integrated circuits images. The proposed system replaces labor-intensive manual annotation process and provides an effective approach for the automated analysis of state-of-the-art deep submicron IC chips.

References

12