Fast and high-resolution mapping of elastic properties of biomolecules and polymers with bimodal AFM

Atomic Force Microscope

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The relation between load and penetration in the axisymmetric boussinesq problem for a punch of arbitrary profile

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Calculation of thermal noise in atomic force microscopy

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Dielectric properties and abnormal C-V characteristics of Ba[sub 0.5]Sr[sub 0.5]TiO₃-Bi[sub 1.5]ZnNb[sub 1.5]O[sub 7] composite thin films grown on MgO (001) substrates by pulsed laser deposition

Huyong Tian, Yu Wang, Danyang Wang et al. · PolyU Institutional Research Archive (Hong Kong Polytechnic University) · 2006 · 646 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

An atomic force microscope tip designed to measure time-varying nanomechanical forces

Özgür Şahin, Sergei Magonov, Chanmin Su et al. · Nature Nanotechnology · 2007 · 482 citations

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