Publication | Open Access
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations
44
Citations
74
References
2018
Year
Materials ScienceEngineeringNear-atomic ScalePhysicsMicroscopyElectron MicroscopyScanning Probe MicroscopyCondensed Matter PhysicsApplied PhysicsDefect CompositionAtomic PhysicsMicroanalysisElectron MicroscopeDefect Formation
Abstract
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