Structural, linear and non-linear optical properties of annealed As47.5Se47.5Ag5 thin films for optoelectronic applications

The Long-Wavelength Edge of Photographic Sensitivity and of the Electronic Absorption of Solids

F. Urbach · Physical Review · 1953 · 5.8K citations

Photonics, Engineering, Physics +13

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Optical Materials, Engineering, Optic Design +17

Behavior of the Electronic Dielectric Constant in Covalent and Ionic Materials

S. H. Wemple, M. DiDomenico · Physical review. B, Solid state · 1971 · 3K citations

Dielectrics, Optical Materials, Engineering +30

Optical Properties of Semiconductors

H. R. Philipp, Hannelore Ehrenreich · Physical Review · 1963 · 2.1K citations

Semiconductors, Ii-vi Semiconductor, Electrical Engineering +13

Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

R. Swanepoel · Journal of Physics E Scientific Instruments · 1984 · 715 citations

Optical Materials, Engineering, Optical Testing +17