Publication | Open Access
Effect of indium doping on the electrical and structural properties of TiO2 thin films used in MOS devices
19
Citations
63
References
2018
Year
Materials ScienceElectrical EngineeringMos DevicesStructural PropertiesEngineeringNanoelectronicsOxide ElectronicsApplied PhysicsGallium OxideSemiconductor MaterialThin FilmsTio2 Thin FilmsThin Film Processing
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