Modified lifetime prediction for multilayer ceramic capacitors based on space charge evolution

Abstract

Accurate lifetime prediction for multilayer ceramic capacitors (MLCCs) is essential to ensure the reliability of electronic systems. A prediction formula based on a physical model has been recently proposed as an alternative to the widely used empirical formula. In this study, we used thermally stimulated depolarization current measurements to demonstrate that the physical model should be modified for low electric fields (<10 V/µm). We propose a new formula for the conditions as well as a modified model that involves an overpotential factor. The new formula suggests that if the applied dc field is less than the threshold value, the breakdown of MLCCs will not occur.