Publication | Closed Access
Fast Defect Inspection Based on Data-Driven Photometric Stereo
38
Citations
30
References
2018
Year
EngineeringComputer-aided DesignNonlinear Reflectance BehaviorIllumination ModelingImage AnalysisFast Defect InspectionComputational ImagingPhotometric StereoFast InspectionComputational GeometryReflectance ModelingGeometric ModelingMachine VisionSurface FinishingNormal PerturbationsAutomated InspectionComputer VisionNatural SciencesComputer Stereo VisionSurface Modeling
Fast inspection of a defect is a challenging task in mass production of curved surfaces, and photometric stereo (PS) utilizing multiple images from a single camera under a number of different illumination directions is a promising technique for this task due to its high sensitivity to surface normal perturbations. This paper adapts conventional PS and extends the technique to the inspection of non-Lambertian surfaces with high accuracy and efficiency. A data-driven PS is presented by establishing the Gaussian process (GP) model to represent the nonlinear reflectance behavior of various materials based on measured reflectance data sets. With the trained GP model, the surface normal can be estimated in two steps: prediction of bidirectional reflectance distribution function values under different light directions and the subsequent least-squares estimation of a surface normal. Comparison tests with other algorithms on the Mitsubishi Electric Research Laboratories data set and real workpieces with non-Lambertian materials show the superior accuracy and efficiency of the proposed method in surface normal estimation. After the surface normal of the workpiece is recovered, the defects can be detected by filtering out the perturbation of the surface normal. Experiments on steel and glossy polyester workpieces validate the efficacy of the proposed approach in detecting defects on curved non-Lambertian surfaces.
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