Depth profile analyses with sub 100-nm depth resolution of a metal thin film by femtosecond - laser ablation - inductively coupled plasma - time-of-flight mass spectrometry

Debora Käser, Lyndsey Hendriks, Joachim Koch, Detlef Günther

Spectrochimica Acta Part B Atomic Spectroscopy · 2018 · 20 citations · 31 references

Concepts

References

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