Publication | Closed Access
Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production
19
Citations
15
References
2018
Year
Materials ScienceEngineeringCrystalline DefectsCrystal DefectsApplied PhysicsDefect FormationSemiconductor Device FabricationMonocrystalline SiliconDefect ToleranceSilicon On InsulatorMicrostructureSilicon Debugging
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