Effect of Annealing Temperature on Structural and Electrical Properties of Al/ZrO2/p-Si MIS Schottky Diodes

Extraction of Schottky diode parameters from forward current-voltage characteristics

S. K. Cheung, N.W. Cheung · Applied Physics Letters · 1986 · 2.7K citations

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Metal-semiconductor contacts

E. H. Rhoderick · IEE Proceedings I Solid State and Electron Devices · 1982 · 1.7K citations

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Fermi level depinning and contact resistivity reduction using a reduced titania interlayer in n-silicon metal-insulator-semiconductor ohmic contacts

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Structural and optical properties of thin zirconium oxide films prepared by reactive direct current magnetron sputtering

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Room-Temperature Preparation of ZrO₂ Precursor Thin Film in an Aqueous Peroxozirconium-Complex Solution

Yanfeng Gao, Yoshitake Masuda, Hiromichi Ohta et al. · Chemistry of Materials · 2004 · 108 citations

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