De-embedding comparisons of 1X-Reflect SFD, 1-port AFR, and 2X-Thru SFD

Abstract

The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.