Publication | Closed Access
Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials
130
Citations
36
References
2018
Year
Materials ScienceIi-vi SemiconductorEngineeringDefect StatesOptical PropertiesSpectroscopyApplied PhysicsWide Band GapSemiconductor MaterialDefect FormationDiffuse Reflectance SpectroscopyOptical SpectroscopySpectroscopic Property
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