Publication | Closed Access

Role of ITO ultra-thin layer in improving electrical performance and thermal reliability of Au/ITO/Si/Au structure: An experimental investigation

Materials EngineeringMaterials ScienceElectrical EngineeringEngineeringAdvanced Packaging (Semiconductors)NanoelectronicsApplied PhysicsThermal ReliabilityElectrical PerformanceSemiconductor MaterialSemiconductor Device FabricationElectronic PackagingDevice ReliabilityMicroelectronicsIto Ultra-thin Layer