A performance evaluation of defect detection by using Denoising AutoEncoder Generative Adversarial Networks

Kyosuke Komoto, Shunsuke Nakatsuka, Hiroaki Aizawa, Kunihito Kato, Hiroyuki Kobayashi, Kazumi Banno

2018 International Workshop on Advanced Image Technology (IWAIT) · 2018 · 13 citations · 1 references

Concepts

Abstract

In this paper, we discuss a method to detect defects in industrial products by using Denoising AutoEncoder Generative Adversarial Networks. In previous methods, a defective area is detected by restoring a defective product image which added an artificial defect to a non-defective product image by Denoising AutoEncoder (DAE). Therefore, a defective area is detected by subtracted image of them. We discuss whether further accuracy improvement is possible by introducing a framework of adversarial learning to DAE in order to restore a defective image to a non-defective image clearer.

References

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