Defect Correction is a methodological framework in image sensor processing that identifies and compensates for pixel-level anomalies in captured imagery, distinguishing itself from general noise reduction techniques by specifically targeting permanent or fixed-pattern defects such as dead or hot pixels.
193
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9.3K
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444
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212
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2017–2026
28
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Publications
193
Alessandra Manes, Massimiliano Palazzini, Enri Leci et al. · European Heart Journal · 2013 · 318 citations · Full text
1–5 of 193
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444
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1–5 of 444
Institutions
212
Xi'an Jiaotong University
Xi'an, China
9 h-index
15 publications
544 citations
Eindhoven University of Technology
Eindhoven, The Netherlands
7 h-index
15 publications
309 citations
Clemson University
Clemson, United States
6 h-index
9 publications
305 citations
TU Wien
Vienna, Austria
6 h-index
11 publications
705 citations
Centrum Wiskunde & Informatica
Amsterdam, The Netherlands
5 h-index
6 publications
356 citations
Nanyang Technological University
Singapore, Singapore
4 h-index
10 publications
558 citations
Ural Branch of the Russian Academy of Sciences
Yekaterinburg, Russia
4 h-index
7 publications
169 citations
Henan Polytechnic University
Jiaozuo, China
4 h-index
11 publications
210 citations
1–8 of 212
Venues
- SIAM Journal on Numerical Analysis
9 publications · 343 citations
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- Journal of Computational and Applied Mathematics
7 publications · 140 citations
7
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- SIAM Journal on Scientific Computing
6 publications · 248 citations
6
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- Numerische Mathematik
6 publications · 408 citations
6
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- Computational Methods in Applied Mathematics
6 publications · 261 citations
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