Acquiring and characterizing plane-to-ray indirect light transport

Abstract

Separation of light transport into direct and indirect paths has enabled new visualizations of light in everyday scenes. However, indirect light itself contains a variety of components from subsurface scattering to diffuse and specular interreflections, all of which contribute to complex visual appearance. In this paper, we present a new imaging technique that captures and analyzes these components of indirect light via light transport between epipolar planes of illumination and rays of received light. This plane-to-ray light transport is captured using a rectified projector-camera system where we vary the offset between projector and camera rows (implemented as synchronization delay) as well as the exposure of each camera row. The resulting delay-exposure stack of images can capture live short and long-range indirect light transport, disambiguate subsurface scattering, diffuse and specular interreflections, and distinguish materials according to their subsurface scattering properties.