Advanced characterization and in-situ growth monitoring of Cu(In,Ga)Se2 thin films and solar cells

Line profiles of neutron powder-diffraction peaks for structure refinement

H. M. Rietveld · Acta Crystallographica · 1967 · 3.6K citations

Natural Sciences, Materials Science, Physics +14

Ab-initio structure determination of LiSbWO6 by X-ray powder diffraction

A. Le Bail, H. Duroy, J.L. Fourquet · Materials Research Bulletin · 1988 · 2.6K citations

Natural Sciences, Materials Engineering, Materials Science +14

Theoretical analysis of the effect of conduction band offset of window/CIS layers on performance of CIS solar cells using device simulation

Takashi Minemoto, Takuya Matsui, Hideyuki Takakura et al. · Solar Energy Materials and Solar Cells · 2001 · 646 citations

Engineering, Materials Engineering, Materials Science +17

Chalcopyrite/defect chalcopyrite heterojunctions on the basis of CuInSe2

D. Schmid, M. Ruckh, F. Grünwald et al. · Journal of Applied Physics · 1993 · 613 citations

Natural Sciences, Materials Engineering, Materials Science +17

A general recursion method for calculating diffracted intensities from crystals containing planar faults

M.M.J. Treacy, J. M. Newsam, Michael W. Deem · Proceedings of the Royal Society of London Series A Mathematical and Physical Sciences · 1991 · 603 citations

Natural Sciences, Materials Science, Computational Materials Science +16