Tuning SERS properties of pattern-based MWNTs-AuNPs substrates by adjustment of the pattern spacings - Concepedia

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Tuning SERS properties of pattern-based MWNTs-AuNPs substrates by adjustment of the pattern spacings

19

Citations

28

References

2018

Year

Hui Mei, Xing Zhao, Shenwei Bai, Qingwen Li, Junchao Xia, Haili Bai, Laifei Cheng

Materials ScienceWafer Scale ProcessingEngineeringBeam LithographySers PropertiesNanotechnologyOptical PropertiesApplied PhysicsPattern TransferPattern-based Mwnts-aunps SubstratesPattern SpacingsOptoelectronicsNanolithography Method

References

	Year	Citations

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