Spectral response characterization of CdTe sensors of different pixel size with the IBEX ASIC

P. Zambon, V. Radicci, Peter Trueb, C. Disch, M. Rissi, T. Sakhelashvili, M. Schneebeli, Ch. Broennimann

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2018 · 47 citations · 23 references

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Abstract

We characterized the spectral response of CdTe sensors with different pixel sizes – namely 75, 150 and 300 μm – bonded to the latest generation IBEX single photon counting ASIC developed at DECTRIS, to detect monochromatic X-ray energy in the range 10–60 keV. We present a comparison of pulse height spectra recorded for several energies, showing the dependence on the pixel size of the non-trivial atomic fluorescence and charge sharing effects that affect the detector response. The extracted energy resolution, in terms of full width at half maximum or FWHM, ranges from 1.5 to 4 keV according to the pixel size and chip configuration. We devoted a careful analysis to the Quantum Efficiency and to the Spectral Efficiency — a newly-introduced measure that quantifies the impact of fluorescence and escape phenomena on the spectrum integrity in high-Z material based detectors. We then investigated the influence of the photon flux on the aforementioned quantities up to 180⋅106 cts/s/mm2 and 50⋅106 cts/s/mm2 for the 150 μm and 300 μm pixel case, respectively. Finally, we complemented the experimental data with analytical and with Monte Carlo simulations – taking into account the stochastic nature of atomic fluorescence – with an excellent agreement.

References

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