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Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

Optical MaterialsEngineeringOptical Thin FilmOptical PropertiesOptical TestingApplied PhysicsSubstrate SpecimensOptical CharacterizationOptical ComponentsOptoelectronicsDepth-graded Multilayer CoatingEnvelope MethodDiffractive Optic