IEEE Transactions on Electron Devices · 2017 · 20 citations · 32 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ModelingPower ManagementSemiconductor Device MaterialsWide Band Gap SemiconductorsDegradationSchottky BarriersSchottky ContactsSilicon Carbide Power DevicesSilicon Carbide Power ElectronicsSwitching Loss ReductionSwitching LossesTransistors For Power Conversion
In this paper, a 4H-SiC trench insulated gate bipolar transistor (IGBT) incorporating a Schottky contact in the collector side is proposed to reduce the turn-off energy loss. The proposed structure is explored and compared with the conventional IGBT using ATLAS. The simulation results have indicated that the reduction in turn-off energy loss is more than 88%, with a slight degradation in the I-V characteristics. Concurrently, with the same on-state voltage drop, the turn-off loss is reduced by a figure of 84%.
32
Doping of SiC by Implantation of Boron and Aluminum
T. Troffer, M. Schadt, Thomas Frank et al. · physica status solidi (a) · 1997 · 294 citations
Edward Van Brunt, Lin Cheng, Michael O’Loughlin et al. · Materials science forum · 2015 · 142 citations · Full text